Hi,
I often use config views (set up using the Heirarchy Editor) to switch between schematic and extracted views of a circuit block during simulations. I would like to run a single ADEXL test which compares a schematic view with the extracted view.
Ideally I'd like to specify which config view to use in a global variable and then sweep that variable during the test. The problem is that the config view used by a ADEXL test is set under the "Design ..." menu, something that can't be parameterized.
Is it possible to set up an ADEXL test so that the config view to be used can be changed via a design variable?
What I want to avoid is the need to create two ADEXL tests. One for the schematic view and one for the extracted view. The issue I have with this approach is that it is difficult to keep the two tests identical. Any changes in one test has to be copied to the other.
The two test approach would be a viable solution if ADXEL allowed one test to be a "child" of another with specific overrides (instead of a full and independent copy).
Any advice would be greatly appreciated. Thanks.
Ivars